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Carl Zeiss Sigma VP300 Field Emission Gun, Variable Pressure Electron Microscope

Sub-items: Oxford Instruments® Micro-Analysis: Energy-dispersive X-ray spectroscopy (EDS) and Wavelength-dispersive X-ray spectroscopy (WDS). (AM) Automatic Mineralogic V 1.09.  

The FEG SEM, featuring an advanced Gemini® objective lens, maximises optical performance for outstanding imaging, even on challenging samples like magnetic materials. Equipped with a WDS detector, it enables precise chemical analysis of trace elements and offers high energy resolution for complex composites. The Mineralogic® software facilitates high-throughput mineralogical analysis for fundamental geoscientific investigations, providing quantitative mineralogy with the ability to calibrate EDX data against reference standards while simultaneously quantifying mineral textures. Additionally, it includes a dedicated mineralogy library for identifying and classifying a wide range of minerals.

Classification:

  • Services > Materials Characterisation > Electron Microscopy > Chemical Analysis > EDX / EDS (Energy-dispersive X-ray spectroscopy) Analysis
  • Services > Materials Characterisation > Electron Microscopy > Wavelength-dispersive X-ray spectroscopy WDS / WDX Analysis
  • Services > Materials Characterisation > Electron Microscopy > Automated Mineralogy ( AM ) > Large Area Chemical Mapping Wavelength-dispersive X-ray spectroscopy EDS / WDS Analysis
  • Services > Materials Characterisation > Electron Microscopy > Variable pressure > Non-conductive imaging
  • Services > Materials Characterisation > Electron Microscopy > Particle Analysis > Microplastic’s/Air monitoring (Oxford Instruments Feature package)