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Hitachi SU70 SEM Electron Microscope Analytical Scanning Electron Microscope

Sub-items: Oxford Instruments® Micro-Analysis : Energy-dispersive X-ray spectroscopy (EDS) and Wavelength-dispersive X-ray spectroscopy (WDS). Gatan® cathodoluminescence detector (CL).  Matelect® ISM-6A Amplifier for Electron-beam-induced current (EBIC)

 

Our Ultra-High-Resolution Schottky Scanning Electron Microscope offers exceptional imaging capabilities. It is equipped for comprehensive chemical analysis using both Energy Dispersive X-ray (EDX) and Wavelength-Dispersive X-ray Spectroscopy (WDS). Additionally, the cathodoluminescence (CL) detector enables users to characterize the optical and electronic properties of materials, as well as to investigate the internal structures of fossils and cementation processes in sedimentary rocks.

Classification:

  • Services > Materials Characterisation > Electron Microscopy > Chemical Analysis > EDX / EDS (Energy-dispersive X-ray spectroscopy) Analysis
  • Services > Materials Characterisation > Electron Microscopy > Wavelength-dispersive X-ray spectroscopy WDS / WDX Analysis
  • Services > Materials Characterisation > Electron Microscopy > Electron-beam-induced current (EBIC)
  • Services > Materials Characterisation > Electron Microscopy > Cathodoluminescence