Our facility offers advanced capabilities for crystallographic and atomic structure analysis through conventional diffraction contrast imaging (bright field/dark field) and selected area/convergent beam diffraction. High-resolution phase contrast imaging is available for studying atomic structures of defects, and interfaces, and imaging individual grains as small as a few nanometres in diameter.

The system supports 80 kV alignment and liquid nitrogen cryo-cooling for beam-sensitive materials. Chemical analysis is facilitated by energy dispersive X-ray (EDX) and electron energy loss spectroscopy (EELS), which can also probe the bonding environment of atoms, such as distinguishing sp2/sp3 bonding in carbon. Additionally, energy-filtered TEM (EFTEM) enables rapid mapping of chemical elements over large regions.

Our scanning transmission electron microscopy (STEM) option includes high-angle annular dark field (HAADF) imaging for detailed structural analysis.

Classification:

• Services > Materials Characterisation > Electron Microscopy > EDX / EDS Analysis
• Services > Materials Characterisation > Electron Microscopy > Bright-Field imaging
• Services > Materials Characterisation > Electron Microscopy > Dark-Field Imaging
• Services > Materials Characterisation > Electron Microscopy > HREM
• Services > Materials Characterisation > Electron Microscopy > Electron Energy Loss Spectroscopy (EELS)
• Services > Materials Characterisation > Electron Microscopy > Cryo-Tomography.