Our Scanners
The Durham Engineering XCT Laboratory hosts two complementary XCT scanners. Depending on your sample size, material composition, and scanning requirements, our team will advise on the most suitable instrument. Below you will find a description, technical specifications, and sample requirements for each. Get in touch if you would like more information or to discuss your project. To find out how to access the facility and apply for scan time, visit our Access and How to Apply page.
RX Solutions EasyTom L
The RX Solutions EasyTom L is the laboratory's newest addition and our largest XCT system. Designed to accommodate bigger samples and heavier components, it is particularly well suited to industrial parts, geological cores, and large engineering specimens that would exceed the capacity of smaller scanners.
The EasyTom L offers exceptional flexibility through its dual source and dual detector configuration. Users can choose between a micro-focus and a nano-focus X-ray source, and between a flat panel detector and a CCD camera, allowing the system to be tailored to the specific demands of each scan, whether that means prioritising field of view, resolution, scan time, or contrast. Its flexible scan geometry and faster acquisition times make it an excellent choice for projects requiring higher throughput, or for preliminary screening before a higher-resolution follow-up scan.
Whether you are inspecting a manufactured component for internal defects or characterising the internal structure of a large natural specimen, the EasyTom L delivers reliable, high-quality results at scale.
Micro-Focus Source and Flat Panel Detector - Technical Specifications
| Specification | Details |
|---|---|
| X-ray Source Energy | 40 kV – 150 kV |
| Minimum Voxel Size | 7 µm |
| Maximum Sample Weight | 35 kg |
| Detector | Vieworks flat panel |
| Detector Pixel Pitch | 124 µm |
| Detector Size | 2048 × 2048 px |
Nano-Focus Source and CCD Detector - Technical Specifications
| Specification | Details |
|---|---|
| X-ray Source Energy | 20 kV – 160 kV |
| Minimum Voxel Size | 0.4 µm |
| Maximum Sample Weight | 35 kg |
| Detector | CCD Camera |
| Detector Pixel Pitch | 9 µm |
| Detector Size | 2672 × 4008 px |
Zeiss Xradia Versa XRM-410
What sets the Zeiss Xradia Versa XRM-410 apart from conventional XCT systems is its dual-stage magnification. Rather than relying solely on geometric magnification, moving the sample closer to the source to project a larger shadow onto the detector, the Versa combines geometric magnification with optical magnification applied after the sample. This means high resolution can be achieved without placing the sample extremely close to the X-ray source, preserving flexibility in sample positioning and allowing a wider range of samples and geometries to be imaged at sub-micron voxel sizes.
This architecture makes the Versa particularly well suited to materials science, biological specimens, porous media, and any application where fine microstructural detail is critical.
Technical Specifications
| Specification | Details |
|---|---|
| X-ray Source Energy | 40 kV – 150 kV |
| X-ray Source Power | 10 W |
| Minimum Voxel Size | 0.9 µm |
| Maximum Sample Weight | 15 kg |